? semiconductor components industries, llc, 2014 june, 2014 ? rev. 5 1 publication order number: esd7008/d esd7008, szesd7008 esd protection diodes low capacitance esd protection for high speed data the esd7008 esd protection diode is designed specifically to protect four high speed differential pairs. ultra?low capacitance and low esd clamping voltage make this device an ideal solution for protecting voltage sensitive high speed data lines. the flow?through style package allows for easy pcb layout and matched trace lengths necessary to maintain consistent impedance for the high speed lines. features ? integrated 4 pairs (8 lines) high speed data ? single connect, flow through routing ? low capacitance (0.12 pf typical, i/o to gnd) ? protection for the following iec standards: iec 61000?4?2 level 4 ? ul flammability rating of 94 v?0 ? sz prefix for automotive and other applications requiring unique site and control change requirements; aec?q101 qualified and ppap capable ? this is a pb?free device typical applications ? v?by?one hs ? thunderbolt (light peak) ? usb 3.0 ? hdmi ? display port ? lvds maximum ratings (t j = 25 c unless otherwise noted) rating symbol value unit operating junction temperature range t j ?55 to +125 c storage temperature range t stg ?55 to +150 c lead solder temperature ? maximum (10 seconds) t l 260 c iec 61000?4?2 contact (esd) iec 61000?4?2 air (esd) esd esd 15 15 kv kv stresses exceeding those listed in the maximum ratings table may damage the device. if any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. see application note and8308/d for further description of survivability specs. marking diagram device package shipping ordering information udfn18 case 517bv http://onsemi.com esd7008mutag udfn18 (pb?free) 3000 / tape & reel ?for information on tape and reel specifications, including part orientation and tape sizes, please refer to our tape and reel packaging specification brochure, brd8011/d. 7008 = specific device code m = date code = pb?free package 1 18 7008m SZESD7008MUTAG udfn18 (pb?free) 3000 / tape & reel
esd7008, szesd7008 http://onsemi.com 2 1 2 3 4 5 6 7 8 9 10 11 18 17 16 15 14 13 12 i/o i/o gnd i/o i/o gnd i/o i/o gnd i/o i/o gnd gnd gnd n/c n/c n/c n/c n/c n/c n/c figure 1. pin schematic figure 2. pin configuration note: only minimum of one pin needs to be connected to ground for functional- ity of all pins. all pins labeled ?n/c? should have no electrical connection. = i/o pin 1 i/o pin 2 gnd pin 3 i/o pin 4 i/o pin 5 gnd pin 6 i/o pin 7 i/o pin 8 gnd pin 9 i/o pin 10 i/o pin 11 gnd pin 13 gnd pin 15 gnd pin 17 note: only minimum of 1 gnd connection required
esd7008, szesd7008 http://onsemi.com 3 electrical characteristics (t a = 25 c unless otherwise specified) parameter symbol conditions min typ max unit reverse working voltage v rwm i/o pin to gnd (note 1) 5.0 v breakdown voltage v br i t = 1 ma, i/o pin to gnd 5.5 6.7 v reverse leakage current i r v rwm = 5 v, i/o pin to gnd 1.0 a clamping voltage (note 1) v c i pp = 1 a, i/o pin to gnd (8 x 20 s pulse) 10 v clamping voltage (note 2) v c iec61000?4?2, 8 kv contact see figures 3 and 4 v clamping voltage tlp (note 3) see figures 8 through 11 v c i pp = 8 a i pp = 16 a 13.2 18.2 junction capacitance c j v r = 0 v, f = 1 mhz between i/o pins and gnd 0.12 0.15 pf junction capacitance difference c j v r = 0 v, f = 1 mhz between i/o pins and gnd 0.02 pf 1. surge current waveform per figure 7. 2. for test procedure see figures 5 and 6 and application note and8307/d. 3. ansi/esd stm5.5.1 ? electrostatic discharge sensitivity testing using transmission line pulse (tlp) model. tlp conditions: z 0 = 50 , t p = 100 ns, t r = 4 ns, averaging window; t 1 = 30 ns to t 2 = 60 ns. figure 3. iec61000?4?2 +8 kv contact clamping voltage figure 4. iec61000?4?2 ?8 kv contact clamping voltage time (ns) time (ns) voltage (v) voltage (v) ?10 0 10 20 30 40 50 60 70 80 90 ?20 0 20 40 60 80 100 120 140 ?50 ?40 ?30 ?20 ?10 0 ?20 0 20 40 60 80 100 120 140
esd7008, szesd7008 http://onsemi.com 4 iec 61000?4?2 spec. level test volt- age (kv) first peak current (a) current at 30 ns (a) current at 60 ns (a) 1 2 7.5 4 2 2 4 15 8 4 3 6 22.5 12 6 4 8 30 16 8 i peak 90% 10% iec61000?4?2 w aveform 100% i @ 30 ns i @ 60 ns t p = 0.7 ns to 1 ns figure 5. iec61000?4?2 spec figure 6. diagram of esd clamping voltage test setup 50 50 cable tvs oscilloscope esd gun the following is taken from application note and8308/d ? interpretation of datasheet parameters for esd devices. esd voltage clamping for sensitive circuit elements it is important to limit the voltage that an ic will be exposed to during an esd event to as low a voltage as possible. the esd clamping voltage is the voltage drop across the esd protection diode during an esd event per the iec61000?4?2 waveform. since the iec61000?4?2 was written as a pass/fail spec for larger systems such as cell phones or laptop computers it is not clearly defined in the spec how to specify a clamping voltage at the device level. on semiconductor has developed a way to examine the entire voltage waveform across the esd protection diode over the time domain of an esd pulse in the form of an oscilloscope screenshot, which can be found on the datasheets for all esd protection diodes. for more information on how on semiconductor creates these screenshots and how to interpret them please refer to and8307/d. figure 7. 8 x 20 s pulse waveform 100 90 80 70 60 50 40 30 20 10 0 020406080 t, time ( s) % of peak pulse current t p t r pulse width (t p ) is defined as that point where the peak current decay = 8 s peak value i rsm @ 8 s half value i rsm /2 @ 20 s
esd7008, szesd7008 http://onsemi.com 5 figure 8. positive tlp i?v curve figure 9. negative tlp i?v curve current (a) voltage (v) current (a) voltage (v) 0 2 4 6 8 10 12 14 16 18 20 22 024681012141618 ?22 ?20 ?18 ?16 ?14 ?12 ?10 ?8 ?6 ?4 ?2 0 22 20 024681012141618 22 20 transmission line pulse (tlp) measurement transmission line pulse (tlp) provides current versus voltage (i?v) curves in which each data point is obtained from a 100 ns long rectangular pulse from a charged transmission line. a simplified schematic of a typical tlp system is shown in figure 10. tlp i?v curves of esd protection devices accurately demonstrate the product?s esd capability because the 10s of amps current levels and under 100 ns time scale match those of an esd event. this is illustrated in figure 11 where an 8 kv iec 61000?4?2 current waveform is compared with tlp current pulses at 8 a and 16 a. a tlp i?v curve shows the voltage at which the device turns on as well as how well the device clamps voltage over a range of current levels. figure 10. simplified schematic of a typical tlp system dut l s oscilloscope attenuator 10 m v c v m i m 50 coax cable 50 coax cable figure 11. comparison between 8 kv iec 61000?4?2 and 8 a and 16 a tlp waveforms
esd7008, szesd7008 http://onsemi.com 6 with esd7008 without esd figure 12. hdmi1.4 eye diagram with and without esd7008. 3.4 gb/s, 400 mv pp with esd7008 without esd figure 13. usb3.0 eye diagram with and without esd7008. 5.0 gb/s, 400 mv pp with esd7008 without esd figure 14. thunderbolt eye diagram with and without esd7008. 10 gb/s, 400 mv pp
esd7008, szesd7008 http://onsemi.com 7 figure 15. esd7008 insertion loss ?10 ?8 ?6 ?4 ?2 0 2 4 1.e+06 1.e+07 1.e+08 1.e+09 1.e+10 frequency (hz) s21 insertion loss (db) esd7008 io?gnd figure 16. usb3.0 layout diagram vbus stda_sstx+ d? stda_sstx? d+ gnd_drain gnd stda_ssrx+ stda_ssrx? usb 3.0 type a connector vbus n/ c n/ c n/c n/c n/c iden or n/c n/ c n/ c esd7008
esd7008, szesd7008 http://onsemi.com 8 esd7008 gnd d0? gnd gnd gnd gnd d3? hot plug detect config1 d3+ config2 dp_pwr d2+ d2? d0+ gnd d1? aux_ch+ d1+ aux_ch? nup4114 esd9x config 1 config 2 aux_ch+ thunderbolt connector figure 17. thunderbolt layout diagram
esd7008, szesd7008 http://onsemi.com 9 figure 18. hdmi layout diagram figure 19. v?by?one hs layout diagram (for lcd panel) hdmi type a connector scl 5v cec gnd d0? gnd d0+ d2? d2+ hpd (and hec _dat ? hdmi 1.4) gnd sda clk ? clk + gnd d1+ d1? gnd n/ c (or hec _dat ? hdmi 1.4) esd7008 nup4114 timing controller v?by?one hs esd7008 connector
esd7008, szesd7008 http://onsemi.com 10 package dimensions udfn18, 5.5x1.5, 0.5p case 517bv issue a dim min max millimeters a 0.45 0.55 a1 0.00 0.05 a3 0.13 ref b 0.15 0.25 d 5.50 bsc d2 0.45 0.55 e 1.50 bsc ea 0.50 bsc l 0.20 0.40 0.10 c d e b a 2x 2x note 4 a a1 (a3) 0.10 c pin one reference 0.10 c 0.05 c c seating plane bottom view b eb 18x 0.10 b 0.05 a c c l side view top view note 3 1 11 12 18 3x *for additional information on our pb?free strategy and soldering details, please download the on semiconductor soldering and mounting techniques reference manual, solderrm/d. soldering footprint* detail a l1 0.00 0.05 dimension: millimeters recommended l1 detail a l optional constructions ?? ?? 0.50 1.80 0.60 0.50 pitch eb 0.75 bsc 3x 0.30 18x e2 0.35 0.45 ea m m d2 e2 note 5 end view 0.75 pitch 1.50 pitch 18x 0.50 l l2 l2 0.10 ref on semiconductor and are registered trademarks of semiconductor components industries, llc (scillc). scillc reserves the right to mak e changes without further notice to any products herein. scillc makes no warranty, representation or guarantee regarding the suitability of its products for an y particular purpose, nor does scillc assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including wi thout limitation special, consequential or incidental damages. ?typical? parameters which may be provided in scillc data sheets and/or specifications can and do vary in different application s and actual performance may vary over time. all operating parameters, including ?typicals? must be validated for each customer application by customer?s technical experts. scillc does not convey any license under its patent rights nor the rights of others. scillc products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the scillc product could create a sit uation where personal injury or death may occur. should buyer purchase or use scillc products for any such unintended or unauthorized application, buyer shall indemnify and hold scillc and its of ficers, employees, subsidiaries, af filiates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, direct ly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that scillc was negligent regarding the design or manufacture of the part. scillc is an equal opportunity/affirmative action employer. this literature is subject to all applicable copyright laws and is not for resale in any manner. p ublication ordering information n. american technical support : 800?282?9855 toll free usa/canada europe, middle east and africa technical support: phone: 421 33 790 2910 japan customer focus center phone: 81?3?5817?1050 esd7008/d literature fulfillment : literature distribution center for on semiconductor p.o. box 5163, denver, colorado 80217 usa phone : 303?675?2175 or 800?344?3860 toll free usa/canada fax : 303?675?2176 or 800?344?3867 toll free usa/canada email : orderlit@onsemi.com on semiconductor website : www.onsemi.com order literature : http://www.onsemi.com/orderlit for additional information, please contact your loc al sales representative
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